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Project Director Jong-Ho Lee Year 2015.06.
Phase Phase 2 2nd year
Research Project 1-1 Ultra low-power/small nano device and reconfigurable 3D integration system
Title Local-Degradation-Induced Threshold Voltage Shift in Turned-OFF Amorphous InGaZnO Thin Film Transistors Under AC Drain Bias Stress
Journal IEEE Electron Device Letters
File (1-5)Local-Degradation-Induced Threshold Voltage Shift in Turned-OFF Amorphous InGaZnO Thin Film Transistors Under AC Drain Bias Stress.pdf(766700)
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